Bulk sensitive hard x-ray photoemission electron microscopy

Probing bulk electronic structure with hard X-ray angle-resolved photoemission.

Traditional ultraviolet/soft X-ray angle-resolved photoemission spectroscopy (ARPES) may in some cases be too strongly influenced by surface effects to be a useful probe of bulk electronic structure. Going to hard X-ray photon energies and thus larger electron inelastic mean-free paths should provide a more accurate picture of bulk electronic structure. We present experimental data for hard X-r...

Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM).

As interest in magnetic devices has increased over the last 20 years, research into nanomagnetism has experienced a corresponding growth. Device applications from magnetic storage to magnetic logic have compelled interest in the influence of geometry and finite size on magnetism and magnetic excitations, in particular where the smallest dimensions reach the important magnetic interaction length...

Boron Doped diamond films as electron donors in photovoltaics: An X-ray absorption and hard X-ray photoemission study

Aberration-corrected multipole Wien filter for energy-filtered x-ray photoemission electron microscopy.

The aberration of a multipole Wien filter for energy-filtered x-ray photoemission electron microscopy was analyzed and the optimized Fourier components of the electric and magnetic fields for the third-order aperture aberration corrections were obtained. It was found that the third-order aperture aberration correction requires 12 electrodes and magnetic poles.

Inner-shell excitation spectroscopy and X-ray photoemission electron microscopy of adhesion promoters.

The C 1s, Si 2p, Si 2s, and O 1s inner-shell excitation spectra of vinyltriethoxysilane, trimethylethoxysilane, and vinyltriacetoxysilane have been recorded by electron energy loss spectroscopy under scattering conditions dominated by electric dipole transitions. The spectra are converted to absolute optical oscillator strength scales and interpreted with the aid of ab initio calculations of th...